Abstract
Harvesting of plasmon-induced hot carriers at the metal/semiconductor interface offers a promising and innovative avenue for solar energy conversion. However, their practical implementation is often hampered by their limited efficiencies. Herein, we have demonstrated a highly efficient plasmonic hot electron transfer with a quantum efficiency (QE) of up to 57 ± 4% from 5.25 nm Au nanoparticles (NPs) to TiO2 films under 400 nm ultrafast laser excitation. The observed hot electron transfer QEs decrease at larger particle sizes, to 20% for 9.1 nm Au, and show negligible changes with excitation wavelengths at 400, 500, and 600 nm. Analysis of the size and excitation wavelength dependent hot electron transfer QEs suggests they contain contributions of interband absorption, indirect plasmon-induced hot electron transfer (PHET), and direct plasmon-induced interfacial charge transfer transition (PICTT) pathways, and QEs of all three pathways increase at smaller Au size. Our result suggests that reducing plasmon particle sizes is a promising approach for efficient plasmonic hot-carrier extraction.
| Original language | English |
|---|---|
| Pages (from-to) | 3253-3258 |
| Number of pages | 6 |
| Journal | Nano Letters |
| Volume | 25 |
| Issue number | 8 |
| DOIs | |
| State | Published - Feb 26 2025 |
Funding
This work was funded by the Department of Energy (DOE), Office of Basic Energy Sciences, under Award Number DE-SC0008798. We would like to thank Emory University Robert P. Apkarian Integrated Electron Microscopy Core Facility for the HRTEM measurements. We acknowledge Oak Ridge National Laboratory for the diffuse reflection spectroscopy (DRS) measurement. N.G. truly thanks Dr. Arun Ashokan and Dr. Sheng He, Post Doctoral fellow, Emory University, for helping with data analysis.
Keywords
- Au nanoparticles
- TiO
- hot electron transfer
- plasmon damping
- surface plasmon resonance