Efficient pattern search in large traces through successive refinement

Felix Wolf, Bernd Mohr, Jack Dongarra, Shirley Moore

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

18 Scopus citations

Abstract

Event tracing is a well-accepted technique for post-mortem performance analysis of parallel applications. The EXPERT tool supports the analysis of large traces by automatically searching them for execution patterns that indicate inefficient behavior. However, the current search algorithm works with independent pattern specifications and ignores the specialization hierarchy existing between them, resulting in a long analysis time caused by repeated matching attempts as well as in replicated code. This article describes an optimized design taking advantage of specialization relationships and leading to a significant runtime improvement as well as to more compact pattern specifications.

Original languageEnglish
Title of host publicationLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
EditorsMarco Danelutto, Marco Vanneschi, Domenico Laforenza
PublisherSpringer Verlag
Pages47-54
Number of pages8
ISBN (Print)3540229248
DOIs
StatePublished - 2004
Externally publishedYes

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume3149
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Fingerprint

Dive into the research topics of 'Efficient pattern search in large traces through successive refinement'. Together they form a unique fingerprint.

Cite this