Efficient microwave absorption with Vn+1CnTx MXenes

Meikang Han, Christopher E. Shuck, Akash Singh, Yizhou Yang, Alexandre C. Foucher, Adam Goad, Bernard McBride, Steven J. May, Vivek B. Shenoy, Eric A. Stach, Yury Gogotsi

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

The availability of MXenes and other two-dimensional conductive nanomaterials with tunable surface chemistry has reshaped the field of electromagnetic protection. However, the high electrical conductivity and low dielectric loss of titanium-based MXenes lead to strong reflection of electromagnetic waves, even when combined with polymers to form composites. Here, we report on the ability of vanadium-based MXenes to provide broadband microwave absorption. Polyurethane composites with ∼2 wt % Vn+1CnTx can absorb 90% of electromagnetic waves covering the entire X band. In addition, pure Vn+1CnTx films of submicrometer thickness can provide effective electromagnetic interference shielding. The free electron transport, surface terminations, native defects, and layers arrangement in composites have profound effects on electronic and dielectric properties of Vn+1CnTx MXenes. This study points toward a new frontier for development of thin and highly absorbing MXene-based electromagnetic protection materials.

Original languageEnglish
Article number101073
JournalCell Reports Physical Science
Volume3
Issue number10
DOIs
StatePublished - Oct 19 2022
Externally publishedYes

Funding

This work was supported by the US National Science Foundation (grant ECCS-2034114 ) and Murata Manufacturing Co., Ltd. (Japan). Ellipsometry and temperature-dependent resistivity measurements (Y.Y. and S.J.M.) were supported by US Department of Energy (DOE), Office of Science, Office of Basic Energy Sciences, grant DE-SC0018618. We thank Mark Anayee, Dr. Dipna A. Patel, Dr. Kanit Hantanasirisakul, Teng Zhang, and Geetha Valurouthu for assistance in MXene characterization. This work was supported by the US National Science Foundation (grant ECCS-2034114) and Murata Manufacturing Co. Ltd. (Japan). Ellipsometry and temperature-dependent resistivity measurements (Y.Y. and S.J.M.) were supported by US Department of Energy (DOE), Office of Science, Office of Basic Energy Sciences, grant DE-SC0018618. We thank Mark Anayee, Dr. Dipna A. Patel, Dr. Kanit Hantanasirisakul, Teng Zhang, and Geetha Valurouthu for assistance in MXene characterization. Conceptualization, M.H. and Y.G.; methodology, M.H. C.E.S. A.S. Y.Y. A.C.F. and A.G.; investigation, M.H. C.E.S. A.S. Y.Y. A.C.F. A.G. and B.M.; funding acquisition, S.J.M. and Y.G.; project administration, Y.G.; supervision, S.J.M. V.B.S. E.A.S. and Y.G.; writing – original draft, M.H. A.S. Y.Y. and A.C.F.; writing – review & editing, C.E.S. A.G. B.M. S.J.M. V.B.S. E.A.S. and Y.G. The authors declare no competing financial interests.

FundersFunder number
Murata Manufacturing Co. Ltd.
Murata Manufacturing Co., Ltd.
National Science FoundationECCS-2034114
U.S. Department of Energy
Office of Science
Basic Energy SciencesDE-SC0018618

    Keywords

    • conductivity
    • dielectric
    • electromagnetic interference shielding
    • microwave absorption
    • MXene
    • thin film
    • two-dimension
    • vanadium carbide

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