Effects of temporary fogging and defogging in plastic scintillators

Matthew Loyd, Matheus Pianassola, Charles Hurlbut, Kyle Shipp, L. Sideropoulos, Ken Weston, Merry Koschan, Charles L. Melcher, Mariya Zhuravleva

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Recent studies have shown that under certain environmental conditions, plastic scintillators which are used in a variety of applications in outdoor environments develop defects called “fogging” resulting in a reduced useful lifetime and increased maintenance cost. Applications of plastic scintillators include scanning recycled steel going into a processing plant, personnel portals to scan employees, and scanning cargo and cars crossing borders of many countries. In this report, fogging was studied in conventional PVT and PS-based plastic scintillators, both field aged and freshly cast. A new fogging-resistant PVT-based formulation developed by scientists at Lawrence Livermore National Laboratory (LLNL) was tested as well. We used accelerated aging experiments via temperature and humidity cycling in controlled laboratory conditions to create observable temporary fogging defects in small samples (≤1 in 3 ). Photoluminescence and optical transmission studies were used to evaluate the effect of the fogging. The time evolution of the induced temporary fogging formation and defogging (i.e. fading of defects in ambient conditions over time) were recorded using optical microscopy, time-lapse photography, and gravimetric analysis.

Original languageEnglish
Pages (from-to)202-208
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume922
DOIs
StatePublished - Apr 1 2019
Externally publishedYes

Funding

This work has been supported by the US Department of Homeland Security, Domestic Nuclear Detection Office , under competitively awarded grant #2017-DN-077-ER0002 . This support does not constitute an expressed or implied endorsement on the part of the Government. The authors would also like to acknowledge Doug Fielden of the University of Tennessee for his extensive help in sample preparation.

Keywords

  • Accelerated aging
  • Gamma detection
  • Optical microscopy
  • Scintillator

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