Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching

G. W. Wright; G. Camarda; E. Kakuno; L. Li; F. Lu; C. Lee; A. Burger; J. Trombka; P. Siddons; R. B. James

doi:10.1117/12.510180

Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching

G. W. Wright, G. Camarda, E. Kakuno, L. Li, F. Lu, C. Lee, A. Burger, J. Trombka, P. Siddons, R. B. James

Research output: Contribution to journal › Conference article › peer-review

17 Scopus citations

Abstract

This study investigates the effectiveness of chemical etchants to remove surface damage caused by mechanical polishing during the fabrication of Cd _0.9Zn_0.1.Te (CZT) nuclear radiation detectors. We evaluate different planar CZT devices fabricated from the same CZT crystals. All detectors used electroless Au for the metal contacts. Different polishing particle sizes ranging from 22.1-μm SiC to 0.05-μm alumina were used, which caused different degrees of surface roughness. Current-voltage measurements and detector testing were used to characterize the effects of surface roughness and etching on the material and detector properties.

Original language	English
Pages (from-to)	306-313
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5198
DOIs	https://doi.org/10.1117/12.510180
State	Published - 2004
Externally published	Yes
Event	Hard X-Ray and Gamma-Ray Detector Physics V - San Diego, CA, United States Duration: Aug 4 2003 → Aug 5 2003

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Wright, G. W., Camarda, G., Kakuno, E., Li, L., Lu, F., Lee, C., Burger, A., Trombka, J., Siddons, P., & James, R. B. (2004). Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching. Proceedings of SPIE - The International Society for Optical Engineering, 5198, 306-313. https://doi.org/10.1117/12.510180

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title = "Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching",

abstract = "This study investigates the effectiveness of chemical etchants to remove surface damage caused by mechanical polishing during the fabrication of Cd 0.9Zn0.1.Te (CZT) nuclear radiation detectors. We evaluate different planar CZT devices fabricated from the same CZT crystals. All detectors used electroless Au for the metal contacts. Different polishing particle sizes ranging from 22.1-μm SiC to 0.05-μm alumina were used, which caused different degrees of surface roughness. Current-voltage measurements and detector testing were used to characterize the effects of surface roughness and etching on the material and detector properties.",

author = "Wright, {G. W.} and G. Camarda and E. Kakuno and L. Li and F. Lu and C. Lee and A. Burger and J. Trombka and P. Siddons and James, {R. B.}",

year = "2004",

doi = "10.1117/12.510180",

language = "English",

volume = "5198",

pages = "306--313",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "Society of Photo-Optical Instrumentation Engineers",

note = "Hard X-Ray and Gamma-Ray Detector Physics V ; Conference date: 04-08-2003 Through 05-08-2003",

}

Wright, GW, Camarda, G, Kakuno, E, Li, L, Lu, F, Lee, C, Burger, A, Trombka, J, Siddons, P & James, RB 2004, 'Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching', Proceedings of SPIE - The International Society for Optical Engineering, vol. 5198, pp. 306-313. https://doi.org/10.1117/12.510180

TY - JOUR

T1 - Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching

AU - Wright, G. W.

AU - Camarda, G.

AU - Kakuno, E.

AU - Li, L.

AU - Lu, F.

AU - Lee, C.

AU - Burger, A.

AU - Trombka, J.

AU - Siddons, P.

AU - James, R. B.

PY - 2004

Y1 - 2004

N2 - This study investigates the effectiveness of chemical etchants to remove surface damage caused by mechanical polishing during the fabrication of Cd 0.9Zn0.1.Te (CZT) nuclear radiation detectors. We evaluate different planar CZT devices fabricated from the same CZT crystals. All detectors used electroless Au for the metal contacts. Different polishing particle sizes ranging from 22.1-μm SiC to 0.05-μm alumina were used, which caused different degrees of surface roughness. Current-voltage measurements and detector testing were used to characterize the effects of surface roughness and etching on the material and detector properties.

AB - This study investigates the effectiveness of chemical etchants to remove surface damage caused by mechanical polishing during the fabrication of Cd 0.9Zn0.1.Te (CZT) nuclear radiation detectors. We evaluate different planar CZT devices fabricated from the same CZT crystals. All detectors used electroless Au for the metal contacts. Different polishing particle sizes ranging from 22.1-μm SiC to 0.05-μm alumina were used, which caused different degrees of surface roughness. Current-voltage measurements and detector testing were used to characterize the effects of surface roughness and etching on the material and detector properties.

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U2 - 10.1117/12.510180

DO - 10.1117/12.510180

M3 - Conference article

AN - SCOPUS:11144355240

SN - 0277-786X

VL - 5198

SP - 306

EP - 313

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Hard X-Ray and Gamma-Ray Detector Physics V

Y2 - 4 August 2003 through 5 August 2003

ER -

Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching

Abstract

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