Effects of strain and buffer layer on interfacial magnetization in Sr2 CrReO6 films determined by polarized neutron reflectometry

Yaohua Liu, J. M. Lucy, A. Glavic, H. Ambaye, V. Lauter, F. Y. Yang, S. G.E. Te Velthuis

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We have determined the depth-resolved magnetization structures of a series of highly ordered Sr2CrReO6 (SCRO) ferrimagnetic epitaxial films via combined studies of x-ray reflectometry, polarized neutron reflectometry, and superconducting quantum interference device magnetometry. The SCRO films deposited directly on (LaAlO3)0.3(Sr2AlTaO6)0.7 or SrTiO3 substrates show reduced magnetization of similar width near the interfaces with the substrates, despite having different degrees of strain. When the SCRO film is deposited on a SrCr0.5Nb0.5O3 (SCNO) double perovskite buffer layer, the width of the interfacial region with reduced magnetization is decreased. However, the relative reduction of the magnetization averaged over the interfacial regions is comparable among the three samples. Interestingly, we found that the magnetization suppression region is wider than the Cr/Re antisite disorder region at the interface between SCRO and SCNO.

Original languageEnglish
Article number104416
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume90
Issue number10
DOIs
StatePublished - Sep 19 2014

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