Abstract
The coincidence of electronic and damage energy dissipation from energetic ions to an atomic lattice can significantly affect damage production along the ion trajectory due to spatial overlap of inelastic and elastic processes. Damage production and disordering in single crystal 3C-SiC from 5 MeV Si and 10 MeV Au ions is investigated using ion-channeling experiments. While defects are created by damage energy dissipation via elastic scattering, electronic energy dissipation via electron-phonon coupling decreases defect survival along the ion trajectory for Si ions. The more energetic recoil spectrum for 10 MeV Au ions leads to weaker spatial coupling of electronic and damage energy dissipation processes, and damage production is only weakly affected.
Original language | English |
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Article number | 101023 |
Journal | Materialia |
Volume | 15 |
DOIs | |
State | Published - Mar 2021 |
Funding
This work was supported primarily by the Governor's Chair Program at the University of Tennessee. The irradiations and two temperature model calculations were supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division under contract number DE-AC05–00OR22725. The authors are grateful to C. Ostrouchov for pysrim calculation on radial distributions of displacements. JL and YY acknowledge support for IM3D simulations from the U.S. Department of Energy, Office of Nuclear Energy's NEUP Program under Grant No. DE-NE0008827.
Funders | Funder number |
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U.S. Department of Energy | |
Office of Science | |
Basic Energy Sciences | |
University of Tennessee | |
Division of Materials Sciences and Engineering | DE-NE0008827, DE-AC05–00OR22725 |
Keywords
- Defects
- Ion irradiation
- Ionization
- Irradiation effect
- Silicon carbide