Effects of negative-bias-temperature-instability on low-frequency noise in SiGe pMOSFETs

Guo Xing Duan, Jordan A. Hachtel, En Xia Zhang, Cher Xuan Zhang, Daniel M. Fleetwood, Ronald D. Schrimpf, Robert A. Reed, Jerome Mitard, Dimitri Linten, Liesbeth Witters, Nadine Collaert, Anda Mocuta, Aaron Voon Yew Thean, Matthew F. Chisholm, Sokrates T. Pantelides

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