Effects of negative-bias-temperature-instability on low-frequency noise in SiGe pMOSFETs
- Guo Xing Duan
- , Jordan A. Hachtel
- , En Xia Zhang
- , Cher Xuan Zhang
- , Daniel M. Fleetwood
- , Ronald D. Schrimpf
- , Robert A. Reed
- , Jerome Mitard
- , Dimitri Linten
- , Liesbeth Witters
- , Nadine Collaert
- , Anda Mocuta
- , Aaron Voon Yew Thean
- , Matthew F. Chisholm
- , Sokrates T. Pantelides
Research output: Contribution to journal › Article › peer-review
18
Scopus
citations