Abstract
Silica samples were implanted with 4 MeV Ti2+ ions at nominal doses ranging from 0.1 to 5.0×1015 cm-2. Optical absorption was measured from 3.5 to 6.5 eV and in all spectra a local maximum at 5.0 eV and a shoulder at 5.9 eV were observed. A second series of samples was implanted with 4 MeV Si2+ ions at nominal doses ranging from 0.5 to 3.0×1015 cm-2. Based on the literature we assumed that Gaussian bands at 4.8, 5.01, 5.17, 5.88, and 7.15 eV comprised the observed spectra. Using Gaussian functions as basis states, linear fits to the data were performed yielding amplitudes for each band. Between 3.5 and 5.5 eV the fits were within ±3%. At larger energies the fits were unsatisfactory. Non-linear fits with an additional, fully adjustable Gaussian function yielded a band at 6.4 eV with full width at half maximum approximately 0.5 eV and reduced the difference between the fit and the data to <2% over the full range of the measurements.
Original language | English |
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Pages (from-to) | 282-288 |
Number of pages | 7 |
Journal | Journal of Non-Crystalline Solids |
Volume | 274 |
Issue number | 1 |
DOIs | |
State | Published - Sep 2000 |
Funding
The authors acknowledge the support of Oak Ridge National Laboratory, managed by Lockheed Martin Energy Research Corporation for the US Department of Energy under contract number DE-AC05-96OR22464.
Funders | Funder number |
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US Department of Energy | DE-AC05-96OR22464 |
Lockheed Martin Corporation | |
Oak Ridge National Laboratory |