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Effects of interface roughness on residual stresses in thermal barrier coatings

  • Chun Hway Hsueh
  • , James A. Haynes
  • , Michael J. Lance
  • , Paul F. Becher
  • , Mattison K. Ferber
  • , Edwin R. Fuller
  • , Stephen A. Langer
  • , W. Craig Carter
  • , W. Roger Cannon

Research output: Contribution to journalArticlepeer-review

106 Scopus citations

Abstract

Using a newly developed object-oriented finite-element analysis method, both an actual microstructure and model microstructures of a plasma-sprayed thermal barrier coating system were numerically simulated to analyze the full-field residual stresses of this coating system. Residual stresses in the actual microstructure were influenced by both the irregular top-coat/bond-coat interface and cracks in the top coat. By treating the microcracked top coat as a more-compliant solid microstructure, the effects of the irregular interface on residual stresses were examined. These results then could be compared to results that have been obtained by analyzing a model microstructure with a sinusoidal interface, which has been considered by some earlier investigators.

Original languageEnglish
Pages (from-to)1073-1075
Number of pages3
JournalJournal of the American Ceramic Society
Volume82
Issue number4
DOIs
StatePublished - 1999

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