Effects of interface roughness on residual stresses in thermal barrier coatings

Chun Hway Hsueh, James A. Haynes, Michael J. Lance, Paul F. Becher, Mattison K. Ferber, Edwin R. Fuller, Stephen A. Langer, W. Craig Carter, W. Roger Cannon

Research output: Contribution to journalArticlepeer-review

101 Scopus citations

Abstract

Using a newly developed object-oriented finite-element analysis method, both an actual microstructure and model microstructures of a plasma-sprayed thermal barrier coating system were numerically simulated to analyze the full-field residual stresses of this coating system. Residual stresses in the actual microstructure were influenced by both the irregular top-coat/bond-coat interface and cracks in the top coat. By treating the microcracked top coat as a more-compliant solid microstructure, the effects of the irregular interface on residual stresses were examined. These results then could be compared to results that have been obtained by analyzing a model microstructure with a sinusoidal interface, which has been considered by some earlier investigators.

Original languageEnglish
Pages (from-to)1073-1075
Number of pages3
JournalJournal of the American Ceramic Society
Volume82
Issue number4
DOIs
StatePublished - 1999

Fingerprint

Dive into the research topics of 'Effects of interface roughness on residual stresses in thermal barrier coatings'. Together they form a unique fingerprint.

Cite this