TY - JOUR
T1 - Effects of impurities on the lattice dynamics of nanocrystalline silicon for thermoelectric application
AU - Claudio, Tania
AU - Schierning, Gabi
AU - Theissmann, Ralf
AU - Wiggers, Hartmut
AU - Schober, Helmut
AU - Koza, Michael Marek
AU - Hermann, Raphaël P.
PY - 2013/4
Y1 - 2013/4
N2 - Doped silicon nanoparticles were exposed to air and sintered to form nanocrystalline silicon. The composition, microstructure, and structural defects were investigated with TEM, XRD, and PDF and the lattice dynamics was evaluated with measurements of the heat capacity, of the elastic constants with resonant ultrasound spectroscopy and of the density of phonon states (DPS) with inelastic neutron scattering. The results were combined and reveal that the samples contain a large amount of silicon dioxide and exhibit properties that deviate from bulk silicon. Both in the reduced DPS and in the heat capacity a Boson peak at low energies, characteristic of amorphous SiO2, is observed. The thermal conductivity is strongly reduced due to nanostructuration and the incorporation of impurities.
AB - Doped silicon nanoparticles were exposed to air and sintered to form nanocrystalline silicon. The composition, microstructure, and structural defects were investigated with TEM, XRD, and PDF and the lattice dynamics was evaluated with measurements of the heat capacity, of the elastic constants with resonant ultrasound spectroscopy and of the density of phonon states (DPS) with inelastic neutron scattering. The results were combined and reveal that the samples contain a large amount of silicon dioxide and exhibit properties that deviate from bulk silicon. Both in the reduced DPS and in the heat capacity a Boson peak at low energies, characteristic of amorphous SiO2, is observed. The thermal conductivity is strongly reduced due to nanostructuration and the incorporation of impurities.
UR - http://www.scopus.com/inward/record.url?scp=84884138383&partnerID=8YFLogxK
U2 - 10.1007/s10853-012-6827-y
DO - 10.1007/s10853-012-6827-y
M3 - Article
AN - SCOPUS:84884138383
SN - 0022-2461
VL - 48
SP - 2836
EP - 2845
JO - Journal of Materials Science
JF - Journal of Materials Science
IS - 7
ER -