Abstract
We report an ion-irradiation study of a compositionally complex (high-entropy) pyrochlore oxide. The damage produced from 4 MeV Au2+ ion irradiation on single crystal (Yb0.2Tm0.2Lu0.2Ho0.2Er0.2)2Ti2O7 aligned along the [100] direction is investigated at room temperature by Rutherford backscattering spectrometry in channeling mode (RBS/C). Damage profiles based on RBS/C are presented and compared to single-component pyrochlore titanate oxides to evaluate the relative resistance to irradiation-induced amorphization. The results show that this high-entropy pyrochlore goes amorphous at a dose of 0.13 dpa, which is comparable to that of single-component pyrochlores previously studied. Transmission electron microscopy images unveil the damaged surface layer, which is consistent with the RBS/C results.
| Original language | English |
|---|---|
| Article number | 114916 |
| Journal | Scripta Materialia |
| Volume | 220 |
| DOIs | |
| State | Published - Nov 2022 |
Funding
CKF acknowledges support from the Center for Materials Processing at the University of Tennessee and NSF Grant # DMR-1808964 . DGM acknowledges support from the National Science Foundation , Grant # DMR-1808964 . XRD was performed at the Institute for Advanced Materials and Manufacturing (IAMM) Diffraction Facility, located at The University of Tennessee, Knoxville. TEM and analysis by C.T.N. supported by the U.S. Department of Energy , Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division using facilities as part of a user project at the Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. The irradiations and RBS/C measurements were performed under partial support from the University of Tennessee National Science Foundation Governor's Chair program and the , Grant # DMR-1808964 . CKF acknowledges support from the Center for Materials Processing at the University of Tennessee and NSF Grant # DMR-1808964. DGM acknowledges support from the National Science Foundation, Grant # DMR-1808964. XRD was performed at the Institute for Advanced Materials and Manufacturing (IAMM) Diffraction Facility, located at The University of Tennessee, Knoxville. TEM and analysis by C.T.N. supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division using facilities as part of a user project at the Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. The irradiations and RBS/C measurements were performed under partial support from the University of TennesseeNational Science Foundation Governor's Chair program and the, Grant # DMR-1808964.
Keywords
- High-entropy pyrochlore
- Ion irradiation
- Rutherford backscattering spectrometry
- Single crystal
- Transmission electron microscopy