Abstract
Measurements using the National Synchrotron Light Source provided a detailed comparisons of the microscale detector response and infrared microscopy images for CdZnTe Frisch-ring x-ray and gamma detectors. Analysis of the data showed conclusively that local deteriorations of the electron charge collection and x-ray device response fully correlate with the presence of Te precipitates as seen in the IR images. Effects of the surface processing conditions on the detector performance were also clearly observed.
Original language | English |
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Article number | 143515 |
Journal | Applied Physics Letters |
Volume | 88 |
Issue number | 14 |
DOIs | |
State | Published - Apr 3 2006 |
Externally published | Yes |
Funding
The authors acknowledge the support of the technical and scientific staff at Brookhaven National Laboratory’s NSLS. Special thanks go to Peter Siddons and Claudio Arnone. One of the authors (B.N.L.) acknowledges the support of U. S. Department of Energy, Office of Nonproliferation Research and Engineering, NA-22. This manuscript has been authored by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH1-886 with the U.S. Department of Energy.
Funders | Funder number |
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Office of Nonproliferation Research and Engineering | NA-22, DE-AC02-98CH1-886 |
U.S. Department of Energy |