Abstract
The effect of reactive elements on the segregation behavior of alumina-nitride alloy grain boundaries was investigated. β-NiAl doped with 0.23 wt % Zr was oxidized in 1 atm O2 at 1500 °C for 50 h. The α-Al2O3 scales formed by the oxidation process were subsequently annealed without any oxygen potential gradient. Scanning transmission electron microscopy was then used to analyze the microstructure and grain boundary segregation levels between the alumina-alloy interface. The results are presented in this paper.
Original language | English |
---|---|
Pages | 670-671 |
Number of pages | 2 |
State | Published - 1994 |
Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Conference
Conference | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
---|---|
City | New Orleans, LA, USA |
Period | 07/31/94 → 08/5/94 |