Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films

Giovanni Esteves; Margeaux Wallace; Raegan Johnson-Wilke; Chris M. Fancher; Rudeger H.T. Wilke; Susan Trolier-Mckinstry; Jacob L. Jones

doi:10.1111/jace.14159

Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films

Giovanni Esteves, Margeaux Wallace, Raegan Johnson-Wilke, Chris M. Fancher, Rudeger H.T. Wilke, Susan Trolier-Mckinstry, Jacob L. Jones

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Ferroelectric/ferroelastic domain reorientation was measured in 2.0 μm thick tetragonal {111}-textured PbZr_0.30Ti_0.70O₃ thin films using synchrotron X-ray diffraction (XRD). Lattice strain from the peak shift in the 111 Bragg reflection and domain reorientation were quantified as a function of applied electric field amplitude. Domain reorientation was quantified through the intensity exchange between the 112 and 211 Bragg reflections. Results from three different film types are reported: dense films that are clamped to the substrate (as-processed), dense films that are partially released from the substrate, and films with 3% volume porosity. The highest amount of domain reorientation is observed in grains that are misoriented with respect to the {111} preferred (domain engineered) orientation. Relative to the clamped films, films that were released from the substrate or had porosity exhibited neither significant enhancement in domain reorientation nor in 111 lattice strain. In contrast, similar experiments on {100}-textured and randomly oriented films showed significant enhancement in domain reorientation in released and porous films. Therefore, {111}-textured films are less susceptible to changes in properties due to mechanical constraints because there is overall less domain reorientation in {111} films than in {100} films.

Original language	English
Pages (from-to)	1802-1807
Number of pages	6
Journal	Journal of the American Ceramic Society
Volume	99
Issue number	5
DOIs	https://doi.org/10.1111/jace.14159
State	Published - May 1 2016
Externally published	Yes

Funding

The authors gratefully acknowledge support of this research from the U.S. National Science Foundation (DMR-1410907 and DMR-1409399), and a National Security Science and Engineering Faculty Fellowship (STM). This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. The technical assistance of Rick Spence at beamline 11-ID-C is gratefully acknowledged. Additionally, the authors gratefully acknowledge Adarsh Rajashekhar for ellipsometry data collection and modeling.

Funders	Funder number
DOE Office of Science
National Security Science and Engineering
U.S. National Science Foundation	DMR-1409399, DMR-1410907
National Science Foundation	1410907, 1409399
U.S. Department of Energy
Office of Science
Argonne National Laboratory	DE-AC02-06CH11357

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title = "Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films",

abstract = "Ferroelectric/ferroelastic domain reorientation was measured in 2.0 μm thick tetragonal {111}-textured PbZr0.30Ti0.70O3 thin films using synchrotron X-ray diffraction (XRD). Lattice strain from the peak shift in the 111 Bragg reflection and domain reorientation were quantified as a function of applied electric field amplitude. Domain reorientation was quantified through the intensity exchange between the 112 and 211 Bragg reflections. Results from three different film types are reported: dense films that are clamped to the substrate (as-processed), dense films that are partially released from the substrate, and films with 3% volume porosity. The highest amount of domain reorientation is observed in grains that are misoriented with respect to the {111} preferred (domain engineered) orientation. Relative to the clamped films, films that were released from the substrate or had porosity exhibited neither significant enhancement in domain reorientation nor in 111 lattice strain. In contrast, similar experiments on {100}-textured and randomly oriented films showed significant enhancement in domain reorientation in released and porous films. Therefore, {111}-textured films are less susceptible to changes in properties due to mechanical constraints because there is overall less domain reorientation in {111} films than in {100} films.",

author = "Giovanni Esteves and Margeaux Wallace and Raegan Johnson-Wilke and Fancher, {Chris M.} and Wilke, {Rudeger H.T.} and Susan Trolier-Mckinstry and Jones, {Jacob L.}",

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AU - Wilke, Rudeger H.T.

AU - Trolier-Mckinstry, Susan

AU - Jones, Jacob L.

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N2 - Ferroelectric/ferroelastic domain reorientation was measured in 2.0 μm thick tetragonal {111}-textured PbZr0.30Ti0.70O3 thin films using synchrotron X-ray diffraction (XRD). Lattice strain from the peak shift in the 111 Bragg reflection and domain reorientation were quantified as a function of applied electric field amplitude. Domain reorientation was quantified through the intensity exchange between the 112 and 211 Bragg reflections. Results from three different film types are reported: dense films that are clamped to the substrate (as-processed), dense films that are partially released from the substrate, and films with 3% volume porosity. The highest amount of domain reorientation is observed in grains that are misoriented with respect to the {111} preferred (domain engineered) orientation. Relative to the clamped films, films that were released from the substrate or had porosity exhibited neither significant enhancement in domain reorientation nor in 111 lattice strain. In contrast, similar experiments on {100}-textured and randomly oriented films showed significant enhancement in domain reorientation in released and porous films. Therefore, {111}-textured films are less susceptible to changes in properties due to mechanical constraints because there is overall less domain reorientation in {111} films than in {100} films.

AB - Ferroelectric/ferroelastic domain reorientation was measured in 2.0 μm thick tetragonal {111}-textured PbZr0.30Ti0.70O3 thin films using synchrotron X-ray diffraction (XRD). Lattice strain from the peak shift in the 111 Bragg reflection and domain reorientation were quantified as a function of applied electric field amplitude. Domain reorientation was quantified through the intensity exchange between the 112 and 211 Bragg reflections. Results from three different film types are reported: dense films that are clamped to the substrate (as-processed), dense films that are partially released from the substrate, and films with 3% volume porosity. The highest amount of domain reorientation is observed in grains that are misoriented with respect to the {111} preferred (domain engineered) orientation. Relative to the clamped films, films that were released from the substrate or had porosity exhibited neither significant enhancement in domain reorientation nor in 111 lattice strain. In contrast, similar experiments on {100}-textured and randomly oriented films showed significant enhancement in domain reorientation in released and porous films. Therefore, {111}-textured films are less susceptible to changes in properties due to mechanical constraints because there is overall less domain reorientation in {111} films than in {100} films.

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Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films

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