Effect of low dose γ-irradiation on DC performance of circular AlGaN/GaN high electron mobility transistors

Ya Hsi Hwang, Yueh Ling Hsieh, Lei Lei, Shun Li, Fan Ren, Stephen J. Pearton, Anupama Yadav, Casey Schwarz, Max Shatkhin, Luther Wang, Elena Flitsiyan, Leonid Chernyak, Albert G. Baca, Andrew A. Allerman, Carlos A. Sanchez, I. I. Kravchenko

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21 Scopus citations

Abstract

The changes in direct current performance of circular-shaped AlGaN/GaN high electron mobility transistors (HEMTs) after 60Co γ-irradiation doses of 50, 300, 450, or 700 Gy were measured. The main effects on the HEMTs after irradiation were increases of both drain current and electron mobility. Compton electrons induced from the absorption of the γ-rays appear to generate donor type defects. Drain current dispersions of ∼5% were observed during gate lag measurements due to the formation of a virtual gate between the gate and drain resulting from the defects generated during γ-irradiation.

Original languageEnglish
Article number031203
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume32
Issue number3
DOIs
StatePublished - May 2014

Funding

FundersFunder number
U.S. Department of Defense1-11-1-0020

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