Abstract
Blistering behavior in polycrystalline tungsten is investigated under low flux helium and hydrogen ion irradiation. Subsequent to irradiation, the grain orientations near (0 1 1), (1 0 1) and (1 1 1) planes on the surface are analyzed by SEM and EBSD. It is found that blister density is the greatest on the grain orientation near (1 1 1) plane, and the smallest on the grain orientation near (0 0 1) plane. Experiments suggest that blistering degree highly depends upon the grain orientation, blisters are easily formed on the grain orientation near (1 1 1) plane, and medium on the grain orientation near (1 0 1) plane, and the most rare on the grain orientation near (0 1 1) plane. The surface resistant orientation of tungsten is orientation near (0 0 1) plane. The atom binding energy in the crystal plane in combination with the channeling effect of adjacent crystal planes may play an important role for the difference of the surface morphology.
| Original language | English |
|---|---|
| Pages (from-to) | 120-123 |
| Number of pages | 4 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 333 |
| DOIs | |
| State | Published - Aug 15 2014 |
| Externally published | Yes |
Funding
This research is supported by National Magnetic Confinement Fusion Programs with Grant Nos. 2011GB108008 and 2013GB109003 , and Natural Science Foundation of China with Grant No. 51171006 .
Keywords
- EBSD
- Grain orientation
- Polycrystalline tungsten