Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory

Douglas A. Blom; Lawrence F. Allard; Satoshi Mishina; Michael A. O'Keefe

doi:10.1017/S1431927606060570

Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory

Douglas A. Blom, Lawrence F. Allard, Satoshi Mishina, Michael A. O'Keefe

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25 Scopus citations

Abstract

The resolution-limiting aberrations of round electromagnetic lenses can now be successfully overcome via the use of multipole element "aberration correctors." The installation and performance of a hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the microscope not to be severely compromised by its environment, a new, specially designed building at Oak Ridge National Laboratory has been built. The Advanced Microscopy Laboratory was designed with the goal of providing a suitable location for aberration-corrected electron microscopes. Construction methods and performance of the building are discussed in the context of the performance of the microscope. Initial performance of the microscope on relevant specimens and modifications made to eliminate resolution-limiting conditions are also discussed.

Original language	English
Pages (from-to)	483-491
Number of pages	9
Journal	Microscopy and Microanalysis
Volume	12
Issue number	6
DOIs	https://doi.org/10.1017/S1431927606060570
State	Published - Dec 2006

Keywords

Aberration-corrected scanning transmission electron microscopy
Atomic resolution
High-angle annular dark-field imaging
Single atom imaging

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10.1017/S1431927606060570

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@article{42d194328a6747ccba9a707b9ac031d0,

title = "Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory",

abstract = "The resolution-limiting aberrations of round electromagnetic lenses can now be successfully overcome via the use of multipole element {"}aberration correctors.{"} The installation and performance of a hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the microscope not to be severely compromised by its environment, a new, specially designed building at Oak Ridge National Laboratory has been built. The Advanced Microscopy Laboratory was designed with the goal of providing a suitable location for aberration-corrected electron microscopes. Construction methods and performance of the building are discussed in the context of the performance of the microscope. Initial performance of the microscope on relevant specimens and modifications made to eliminate resolution-limiting conditions are also discussed.",

keywords = "Aberration-corrected scanning transmission electron microscopy, Atomic resolution, High-angle annular dark-field imaging, Single atom imaging",

author = "Blom, {Douglas A.} and Allard, {Lawrence F.} and Satoshi Mishina and O'Keefe, {Michael A.}",

year = "2006",

month = dec,

doi = "10.1017/S1431927606060570",

language = "English",

volume = "12",

pages = "483--491",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "6",

}

TY - JOUR

T1 - Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory

AU - Blom, Douglas A.

AU - Allard, Lawrence F.

AU - Mishina, Satoshi

AU - O'Keefe, Michael A.

PY - 2006/12

Y1 - 2006/12

N2 - The resolution-limiting aberrations of round electromagnetic lenses can now be successfully overcome via the use of multipole element "aberration correctors." The installation and performance of a hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the microscope not to be severely compromised by its environment, a new, specially designed building at Oak Ridge National Laboratory has been built. The Advanced Microscopy Laboratory was designed with the goal of providing a suitable location for aberration-corrected electron microscopes. Construction methods and performance of the building are discussed in the context of the performance of the microscope. Initial performance of the microscope on relevant specimens and modifications made to eliminate resolution-limiting conditions are also discussed.

AB - The resolution-limiting aberrations of round electromagnetic lenses can now be successfully overcome via the use of multipole element "aberration correctors." The installation and performance of a hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the microscope not to be severely compromised by its environment, a new, specially designed building at Oak Ridge National Laboratory has been built. The Advanced Microscopy Laboratory was designed with the goal of providing a suitable location for aberration-corrected electron microscopes. Construction methods and performance of the building are discussed in the context of the performance of the microscope. Initial performance of the microscope on relevant specimens and modifications made to eliminate resolution-limiting conditions are also discussed.

KW - Aberration-corrected scanning transmission electron microscopy

KW - Atomic resolution

KW - High-angle annular dark-field imaging

KW - Single atom imaging

UR - http://www.scopus.com/inward/record.url?scp=33947528661&partnerID=8YFLogxK

U2 - 10.1017/S1431927606060570

DO - 10.1017/S1431927606060570

M3 - Article

AN - SCOPUS:33947528661

SN - 1431-9276

VL - 12

SP - 483

EP - 491

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 6

ER -

Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory

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Keywords

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