Abstract
In order to predict heat loads in future saturable-core fault-current-limiting devices due to ac fringing fields, dynamic resistance in YBCO-coated conductors was measured at 77Kin peak ac fields up to 25 mT at 60 Hz and in dc fields up to 1 T. With the sample orientation set such that the conductor face was either parallel or perpendicular to the ac and dc applied fields, the dynamic resistance was measured at different fractions of the critical current to determine the relationship between the dc transport current and the applied fields. With respect to field orientation, the dynamic resistance for ac fields that were perpendicular to the conductor face was significantly higher than when the ac fields were parallel to the conductor face. It was also observed that the dynamic resistance: 1) increased with increasing fraction of the dc transport current to the critical current, 2) was proportional to the inverse of the critical current, and 3) demonstrated a linear dependence with the applied ac field once a threshold field was exceeded. This functional behavior was consistent with a critical state model for the dynamic resistance, but discrepancies in absolute value of the dynamic resistance suggested that further theoretical development is needed.
Original language | English |
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Article number | 5617303 |
Pages (from-to) | 3251-3256 |
Number of pages | 6 |
Journal | IEEE Transactions on Applied Superconductivity |
Volume | 21 |
Issue number | 3 PART 3 |
DOIs | |
State | Published - Jun 2011 |
Funding
Manuscript received August 03, 2010; accepted September 27, 2010. Date of publication November 01, 2010; date of current version May 27, 2011. This work was supported by the U.S. Department of Energy, Office of Electricity Delivery and Energy Reliability, Advanced Cables and Conductors, under Contract DE-AC05-00OR22725, with Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC.
Funders | Funder number |
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U.S. Department of Energy | DE-AC05-00OR22725 |
Oak Ridge National Laboratory |
Keywords
- Dynamic Resistance
- Fault current limiters
- Loss measurement