Dynamic mechanical control of local vacancies in NiO thin films

Daehee Seol, Sang Mo Yang, Stephen Jesse, Minseok Choi, Inrok Hwang, Taekjib Choi, Bae Ho Park, Sergei V. Kalinin, Yunseok Kim

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The manipulation of local ionic behavior via external stimuli in oxide systems is of great interest because it can help in directly tuning material properties. Among external stimuli, mechanical force has attracted intriguing attention as novel stimulus for ionic modulation. Even though effectiveness of mechanical force on local ionic modulation has been validated in terms of static effect, its real-time i.e., dynamic, behavior under an application of the force is barely investigated in spite of its crucial impact on device performance such as force or pressure sensors. In this study, we explore dynamic ionic behavior modulated by mechanical force in NiO thin films using electrochemical strain microscopy (ESM). Ionically mediated ESM hysteresis loops were significantly varied under an application of mechanical force. Based on these results, we were able to investigate relative relationship between the force and voltage effects on ionic motion and, further, control effectively ionic behavior through combination of mechanical and electrical stimuli. Our results can provide comprehensive information on the effect of mechanical forces on ionic dynamics in ionic systems.

Original languageEnglish
Article number275709
JournalNanotechnology
Volume29
Issue number27
DOIs
StatePublished - May 8 2018

Funding

This work was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning (NRF-2014R1A1A1008061, NRF-2014R1A4A1008474, NRF-2013R1 A3A2042120 and NRF-2017R1A2B2003342). The AFM measurements were conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility (CNMS2013-303).

Keywords

  • electrical modulation
  • electrochemical strain microscopy
  • manipulation of ionic behavior
  • mechanical modulation
  • vacancy

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