Fingerprint
Dive into the research topics of 'Dynamic Defect Detection in Fast, Robust NDE Methods by Transfer Learning Based Optimally Binned Hypothesis Tests'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Dynamic Defect Detection in Fast, Robust NDE Methods by Transfer Learning Based Optimally Binned Hypothesis Tests
Subrata Mukherjee, Lei Peng, Lalita Udpa, Yiming Deng
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations