Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy

Z. Y. Zhao; W. M. Zhang; C. Yi; A. D. Stiff-Roberts; B. J. Rodriguez; A. P. Baddorf

doi:10.1109/LEOS.2007.4382260

Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy

Z. Y. Zhao, W. M. Zhang, C. Yi, A. D. Stiff-Roberts, B. J. Rodriguez, A. P. Baddorf

Scanning Tunneling Microscopy Group

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Cross-section of multi-layer InAs/GaAs quantum dot heterostructure has been characterized using scanning capacitance microscopy to investigate dopant incorporation into quantum dots. Simulation of the corresponding band structure is used to better understand the experimental results.

Original language	English
Title of host publication	LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings
Pages	32-33
Number of pages	2
DOIs	https://doi.org/10.1109/LEOS.2007.4382260
State	Published - 2007
Event	20th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Lake Buena Vista, FL, United States Duration: Oct 21 2007 → Oct 25 2007

Publication series

Name	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)	1092-8081

Conference

Conference	20th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Country/Territory	United States
City	Lake Buena Vista, FL
Period	10/21/07 → 10/25/07

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10.1109/LEOS.2007.4382260

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Zhao, Z. Y., Zhang, W. M., Yi, C., Stiff-Roberts, A. D., Rodriguez, B. J., & Baddorf, A. P. (2007). Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy. In LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings (pp. 32-33). Article 4382260 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). https://doi.org/10.1109/LEOS.2007.4382260

@inproceedings{c59cd5f0fdfa4a80802e206713f4a9d7,

title = "Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy",

abstract = "Cross-section of multi-layer InAs/GaAs quantum dot heterostructure has been characterized using scanning capacitance microscopy to investigate dopant incorporation into quantum dots. Simulation of the corresponding band structure is used to better understand the experimental results.",

author = "Zhao, {Z. Y.} and Zhang, {W. M.} and C. Yi and Stiff-Roberts, {A. D.} and Rodriguez, {B. J.} and Baddorf, {A. P.}",

year = "2007",

doi = "10.1109/LEOS.2007.4382260",

language = "English",

isbn = "142440925X",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

pages = "32--33",

booktitle = "LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings",

note = "20th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS ; Conference date: 21-10-2007 Through 25-10-2007",

}

Zhao, ZY, Zhang, WM, Yi, C, Stiff-Roberts, AD, Rodriguez, BJ & Baddorf, AP 2007, Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy. in LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings., 4382260, Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, pp. 32-33, 20th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS, Lake Buena Vista, FL, United States, 10/21/07. https://doi.org/10.1109/LEOS.2007.4382260

Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy. / Zhao, Z. Y.; Zhang, W. M.; Yi, C. et al.
LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings. 2007. p. 32-33 4382260 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy

AU - Zhao, Z. Y.

AU - Zhang, W. M.

AU - Yi, C.

AU - Stiff-Roberts, A. D.

AU - Rodriguez, B. J.

AU - Baddorf, A. P.

PY - 2007

Y1 - 2007

N2 - Cross-section of multi-layer InAs/GaAs quantum dot heterostructure has been characterized using scanning capacitance microscopy to investigate dopant incorporation into quantum dots. Simulation of the corresponding band structure is used to better understand the experimental results.

AB - Cross-section of multi-layer InAs/GaAs quantum dot heterostructure has been characterized using scanning capacitance microscopy to investigate dopant incorporation into quantum dots. Simulation of the corresponding band structure is used to better understand the experimental results.

UR - http://www.scopus.com/inward/record.url?scp=51249117882&partnerID=8YFLogxK

U2 - 10.1109/LEOS.2007.4382260

DO - 10.1109/LEOS.2007.4382260

M3 - Conference contribution

AN - SCOPUS:51249117882

SN - 142440925X

SN - 9781424409259

T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

SP - 32

EP - 33

BT - LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings

T2 - 20th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

Y2 - 21 October 2007 through 25 October 2007

ER -

Zhao ZY, Zhang WM, Yi C, Stiff-Roberts AD, Rodriguez BJ, Baddorf AP. Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy. In LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings. 2007. p. 32-33. 4382260. (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). doi: 10.1109/LEOS.2007.4382260

Doping characterization of InAs/GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy

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