Abstract
This paper presents an asymptotic model for the unsteady transport of a dopant during the growth of a semiconductor crystal from a melt with an externally applied magnetic field. The melt is divided into (1) mass-diffusion boundary layers where convective and diffusive mass transfer are comparable, and (2) a core region where diffusion is negligible, so that the concentration of each fluid particle is constant. A Lagrangian description of motion is used to track each fluid particle during its transits across the core between diffusion layers. The dopant distribution in each layer depends on the concentrations of all fluid particles which are entering this layer. The dopant distribution is very non-uniform throughout the melt and is far from the instantaneous steady state at every stage during crystal growth. The transient asymptotic model predicts the dopant distribution in the entire crystal.
| Original language | English |
|---|---|
| Pages (from-to) | 124-135 |
| Number of pages | 12 |
| Journal | Journal of Crystal Growth |
| Volume | 172 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - Feb 1997 |
| Externally published | Yes |
Funding
This research was supported by the National Aeronautics and Space Administration under Cooperative Research Agreement NCC8-90 and by the National Science Foundation under Grant CTS 94-19484. The calculations were performed on the SGI Power Challenge supercomputer at the National Center for Supercomputing Applications at the University of Illinois at Urbana-Champaign under Grant CTS 96-0024N.