Dopant transport during semiconductor crystal growth with magnetically damped buoyant convection

N. Ma, J. S. Walker

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28 Scopus citations

Abstract

This paper presents an asymptotic model for the unsteady transport of a dopant during the growth of a semiconductor crystal from a melt with an externally applied magnetic field. The melt is divided into (1) mass-diffusion boundary layers where convective and diffusive mass transfer are comparable, and (2) a core region where diffusion is negligible, so that the concentration of each fluid particle is constant. A Lagrangian description of motion is used to track each fluid particle during its transits across the core between diffusion layers. The dopant distribution in each layer depends on the concentrations of all fluid particles which are entering this layer. The dopant distribution is very non-uniform throughout the melt and is far from the instantaneous steady state at every stage during crystal growth. The transient asymptotic model predicts the dopant distribution in the entire crystal.

Original languageEnglish
Pages (from-to)124-135
Number of pages12
JournalJournal of Crystal Growth
Volume172
Issue number1-2
DOIs
StatePublished - Feb 1997
Externally publishedYes

Funding

This research was supported by the National Aeronautics and Space Administration under Cooperative Research Agreement NCC8-90 and by the National Science Foundation under Grant CTS 94-19484. The calculations were performed on the SGI Power Challenge supercomputer at the National Center for Supercomputing Applications at the University of Illinois at Urbana-Champaign under Grant CTS 96-0024N.

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