Abstract
Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.
| Original language | English |
|---|---|
| Pages (from-to) | 1848-1857 |
| Number of pages | 10 |
| Journal | Journal of the American Ceramic Society |
| Volume | 98 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 1 2015 |