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Domain structure control of BiFeO3 films through substrate symmetry and film thickness

  • C. T. Nelson
  • , Y. Zhang
  • , C. M. Folkman
  • , C. B. Eom
  • , J. F. Mansfield
  • , X. Q. Pan

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)1030-1031
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009
Externally publishedYes

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