Domain evolution in lead-free thin film piezoelectric ceramics

Meredith E. Rogers; Chris M. Fancher; John E. Blendell

doi:10.1063/1.4746088

Domain evolution in lead-free thin film piezoelectric ceramics

Meredith E. Rogers, Chris M. Fancher, John E. Blendell

Purdue University

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Due to environmental and health concerns lead-free piezoelectric systems are currently being evaluated for use as replacements for lead-based ceramics. (1-x)Na _0.5Bi _0.5TiO ₃ - xBaTiO ₃ (NBT-xBT) is a promising alternative. In order to develop materials with improved performance, it is necessary to understand local structure effects on the piezoelectric response at the grain level. Using piezoresponse force microscopy (PFM), we have studied the domain evolution under locally applied electric fields. Using pulsed laser deposition thin films are deposited on Pt/Ti/SiO ₂/Si substrates at a temperature of 650°C in a 150 mTorr O ₂ environment. In NBT-0.05BT films, domains are clearly visible after the application of a bias field and they relax after a period of time. After the films are exposed to ambient conditions for several weeks, they must be annealed before domains are again visible with PFM. Domain images after poling indicate that the polarization direction is rotating in the plane of the sample.

Original language	English
Article number	052014
Journal	Journal of Applied Physics
Volume	112
Issue number	5
DOIs	https://doi.org/10.1063/1.4746088
State	Published - Sep 1 2012
Externally published	Yes

Access to Document

10.1063/1.4746088

Cite this

@article{fc1f8bce4d8a4b199471c9dba7c6c87b,

title = "Domain evolution in lead-free thin film piezoelectric ceramics",

abstract = "Due to environmental and health concerns lead-free piezoelectric systems are currently being evaluated for use as replacements for lead-based ceramics. (1-x)Na 0.5Bi 0.5TiO 3 - xBaTiO 3 (NBT-xBT) is a promising alternative. In order to develop materials with improved performance, it is necessary to understand local structure effects on the piezoelectric response at the grain level. Using piezoresponse force microscopy (PFM), we have studied the domain evolution under locally applied electric fields. Using pulsed laser deposition thin films are deposited on Pt/Ti/SiO 2/Si substrates at a temperature of 650°C in a 150 mTorr O 2 environment. In NBT-0.05BT films, domains are clearly visible after the application of a bias field and they relax after a period of time. After the films are exposed to ambient conditions for several weeks, they must be annealed before domains are again visible with PFM. Domain images after poling indicate that the polarization direction is rotating in the plane of the sample.",

author = "Rogers, {Meredith E.} and Fancher, {Chris M.} and Blendell, {John E.}",

year = "2012",

month = sep,

day = "1",

doi = "10.1063/1.4746088",

language = "English",

volume = "112",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Domain evolution in lead-free thin film piezoelectric ceramics

AU - Rogers, Meredith E.

AU - Fancher, Chris M.

AU - Blendell, John E.

PY - 2012/9/1

Y1 - 2012/9/1

N2 - Due to environmental and health concerns lead-free piezoelectric systems are currently being evaluated for use as replacements for lead-based ceramics. (1-x)Na 0.5Bi 0.5TiO 3 - xBaTiO 3 (NBT-xBT) is a promising alternative. In order to develop materials with improved performance, it is necessary to understand local structure effects on the piezoelectric response at the grain level. Using piezoresponse force microscopy (PFM), we have studied the domain evolution under locally applied electric fields. Using pulsed laser deposition thin films are deposited on Pt/Ti/SiO 2/Si substrates at a temperature of 650°C in a 150 mTorr O 2 environment. In NBT-0.05BT films, domains are clearly visible after the application of a bias field and they relax after a period of time. After the films are exposed to ambient conditions for several weeks, they must be annealed before domains are again visible with PFM. Domain images after poling indicate that the polarization direction is rotating in the plane of the sample.

AB - Due to environmental and health concerns lead-free piezoelectric systems are currently being evaluated for use as replacements for lead-based ceramics. (1-x)Na 0.5Bi 0.5TiO 3 - xBaTiO 3 (NBT-xBT) is a promising alternative. In order to develop materials with improved performance, it is necessary to understand local structure effects on the piezoelectric response at the grain level. Using piezoresponse force microscopy (PFM), we have studied the domain evolution under locally applied electric fields. Using pulsed laser deposition thin films are deposited on Pt/Ti/SiO 2/Si substrates at a temperature of 650°C in a 150 mTorr O 2 environment. In NBT-0.05BT films, domains are clearly visible after the application of a bias field and they relax after a period of time. After the films are exposed to ambient conditions for several weeks, they must be annealed before domains are again visible with PFM. Domain images after poling indicate that the polarization direction is rotating in the plane of the sample.

UR - http://www.scopus.com/inward/record.url?scp=84866361039&partnerID=8YFLogxK

U2 - 10.1063/1.4746088

DO - 10.1063/1.4746088

M3 - Article

AN - SCOPUS:84866361039

SN - 0021-8979

VL - 112

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

M1 - 052014

ER -

Domain evolution in lead-free thin film piezoelectric ceramics

Abstract

Access to Document

Other files and links

Fingerprint

Cite this