Domain configurations in ferroelectric PbTiO3 thin films: The influence of substrate and film thickness

S. Stemmer, S. K. Streiffer, F. Ernst, M. Rühle, W. Y. Hsu, R. Raj

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Abstract

Using transmission electron microscopy, we have compared the domain configurations in epitaxial, ferroelectric PbTiO3 films grown on different substrates and to different film thicknesses. These configurations change considerably between the different samples. In addition, we have characterized the film/substrate interfaces by high-resolution transmission electron microscopy. It is proposed that the elastic properties of the substrate play a role in determining the domain configuration by influencing the accommodation of tilts of the film lattice.

Original languageEnglish
Pages (from-to)43-48
Number of pages6
JournalSolid State Ionics
Volume75
Issue numberC
DOIs
StatePublished - Jan 1995
Externally publishedYes

Funding

SK. Streifferw ould like to thank the Alexander von Humboldt-Stiftung for financial assistance.W e also thank the Max-Planck Gesellschaftf or support.R . Raj and W.-Y. Hsu received support from the National Science Foundation, Award No. DMR-9 I? 1654, through the Materials Science Center at Cornell University.

Keywords

  • Domain configuration
  • Ferroelectrics, HRTEM
  • Film/substrate interfaces

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