@inproceedings{8b35c749ba6e4081b46a7d4851fd4b32,
title = "Distilling Knowledge from Ensembles of Cluster-Constrained-Attention Multiple-Instance Learners for Whole Slide Image Classification",
abstract = "The peculiar nature of whole slide imaging (WSI), digitizing conventional glass slides to obtain multiple high resolution images which capture microscopic details of a patient's histopathological features, has garnered increased interest from the computer vision research community over the last two decades. Given the unique computational space and time complexity inherent to gigapixel-size whole slide image data, researchers have proposed novel machine learning algorithms to aid in the performance of diagnostic tasks in clinical pathology. One effective algorithm represents a Whole slide image as a bag of smaller image patches, which can be represented as low-dimension image patch embeddings. Weakly supervised deep-learning methods, such as cluster-constrained-attention multiple instance learning (CLAM), have shown promising results when combined with image patch embeddings. While traditional ensemble classifiers yield improved task performance, such methods come with a steep cost in model complexity. Through knowledge distillation, it is possible to retain some performance improvements from an ensemble, while minimizing costs to model complexity. In this work, we implement a weakly supervised ensemble using clustering-constrained-attention multiple-instance learners (CLAM), which uses attention and instance-level clustering to identify task salient regions and feature extraction in whole slides. By applying logit-based and attention-based knowledge distillation, we show it is possible to retain some performance improvements resulting from the ensemble at zero cost to model complexity.",
keywords = "attention, clam, deep learning, ensemble, knowledge distillation, logits, model compression, multiple instance learning, pathology, resnet50, weak supervision, whole slide imaging",
author = "Folami Alamudun and Jacob Hinkle and Sajal Dash and Benjamin Hernandez and Aristeidis Tsaris and Yoon, {Hong Jun}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Conference on Big Data, Big Data 2022 ; Conference date: 17-12-2022 Through 20-12-2022",
year = "2022",
doi = "10.1109/BigData55660.2022.10020938",
language = "English",
series = "Proceedings - 2022 IEEE International Conference on Big Data, Big Data 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "3393--3397",
editor = "Shusaku Tsumoto and Yukio Ohsawa and Lei Chen and {Van den Poel}, Dirk and Xiaohua Hu and Yoichi Motomura and Takuya Takagi and Lingfei Wu and Ying Xie and Akihiro Abe and Vijay Raghavan",
booktitle = "Proceedings - 2022 IEEE International Conference on Big Data, Big Data 2022",
}