Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

Kevin M. Roccapriore; Max Schwarzer; Joshua Greaves; Jesse Farebrother; Rishabh Agarwal; Colton Bishop; Maxim Ziatdinov; Igor Mordatch; Ekin D. Cubuk; Aaron Courville; Pablo Samuel Castro; Marc G. Bellemare; Sergei V. Kalinin

doi:10.1093/micmic/ozad067.1000

Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

Kevin M. Roccapriore
, Max Schwarzer
, Joshua Greaves
, Jesse Farebrother
, Rishabh Agarwal
, Colton Bishop
, Maxim Ziatdinov
, Igor Mordatch
, Ekin D. Cubuk
, Aaron Courville
, Pablo Samuel Castro
, Marc G. Bellemare
, Sergei V. Kalinin

Data Nanoanalytics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1932-1933
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.1000
State	Published - Jul 22 2023

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10.1093/micmic/ozad067.1000

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Roccapriore, K. M., Schwarzer, M., Greaves, J., Farebrother, J., Agarwal, R., Bishop, C., Ziatdinov, M., Mordatch, I., Cubuk, E. D., Courville, A., Castro, P. S., Bellemare, M. G., & Kalinin, S. V. (2023). Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM. Microscopy and Microanalysis, 29(1), 1932-1933. https://doi.org/10.1093/micmic/ozad067.1000

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title = "Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM",

author = "Roccapriore, \{Kevin M.\} and Max Schwarzer and Joshua Greaves and Jesse Farebrother and Rishabh Agarwal and Colton Bishop and Maxim Ziatdinov and Igor Mordatch and Cubuk, \{Ekin D.\} and Aaron Courville and Castro, \{Pablo Samuel\} and Bellemare, \{Marc G.\} and Kalinin, \{Sergei V.\}",

year = "2023",

month = jul,

day = "22",

doi = "10.1093/micmic/ozad067.1000",

language = "English",

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pages = "1932--1933",

journal = "Microscopy and Microanalysis",

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Roccapriore, KM, Schwarzer, M, Greaves, J, Farebrother, J, Agarwal, R, Bishop, C, Ziatdinov, M, Mordatch, I, Cubuk, ED, Courville, A, Castro, PS, Bellemare, MG & Kalinin, SV 2023, 'Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM', Microscopy and Microanalysis, vol. 29, no. 1, pp. 1932-1933. https://doi.org/10.1093/micmic/ozad067.1000

TY - JOUR

T1 - Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

AU - Roccapriore, Kevin M.

AU - Schwarzer, Max

AU - Greaves, Joshua

AU - Farebrother, Jesse

AU - Agarwal, Rishabh

AU - Bishop, Colton

AU - Ziatdinov, Maxim

AU - Mordatch, Igor

AU - Cubuk, Ekin D.

AU - Courville, Aaron

AU - Castro, Pablo Samuel

AU - Bellemare, Marc G.

AU - Kalinin, Sergei V.

PY - 2023/7/22

Y1 - 2023/7/22

UR - https://www.scopus.com/pages/publications/85168603192

U2 - 10.1093/micmic/ozad067.1000

DO - 10.1093/micmic/ozad067.1000

M3 - Article

C2 - 37612921

AN - SCOPUS:85168603192

SN - 1431-9276

VL - 29

SP - 1932

EP - 1933

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 1

ER -

Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

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