Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

Kevin M. Roccapriore; Max Schwarzer; Joshua Greaves; Jesse Farebrother; Rishabh Agarwal; Colton Bishop; Maxim Ziatdinov; Igor Mordatch; Ekin D. Cubuk; Aaron Courville; Pablo Samuel Castro; Marc G. Bellemare; Sergei V. Kalinin

doi:10.1093/micmic/ozad067.1000

Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

Kevin M. Roccapriore, Max Schwarzer, Joshua Greaves, Jesse Farebrother, Rishabh Agarwal, Colton Bishop, Maxim Ziatdinov, Igor Mordatch, Ekin D. Cubuk, Aaron Courville, Pablo Samuel Castro, Marc G. Bellemare, Sergei V. Kalinin

Data Nanoanalytics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1932-1933
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.1000
State	Published - Jul 22 2023

Access to Document

10.1093/micmic/ozad067.1000

Cite this

Roccapriore, K. M., Schwarzer, M., Greaves, J., Farebrother, J., Agarwal, R., Bishop, C., Ziatdinov, M., Mordatch, I., Cubuk, E. D., Courville, A., Castro, P. S., Bellemare, M. G., & Kalinin, S. V. (2023). Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM. Microscopy and Microanalysis, 29(1), 1932-1933. https://doi.org/10.1093/micmic/ozad067.1000

@article{9ca582ee98d94d25a4b51fafc93ccaa2,

title = "Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM",

author = "Roccapriore, {Kevin M.} and Max Schwarzer and Joshua Greaves and Jesse Farebrother and Rishabh Agarwal and Colton Bishop and Maxim Ziatdinov and Igor Mordatch and Cubuk, {Ekin D.} and Aaron Courville and Castro, {Pablo Samuel} and Bellemare, {Marc G.} and Kalinin, {Sergei V.}",

year = "2023",

month = jul,

day = "22",

doi = "10.1093/micmic/ozad067.1000",

language = "English",

volume = "29",

pages = "1932--1933",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "1",

}

Roccapriore, KM, Schwarzer, M, Greaves, J, Farebrother, J, Agarwal, R, Bishop, C, Ziatdinov, M, Mordatch, I, Cubuk, ED, Courville, A, Castro, PS, Bellemare, MG & Kalinin, SV 2023, 'Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM', Microscopy and Microanalysis, vol. 29, no. 1, pp. 1932-1933. https://doi.org/10.1093/micmic/ozad067.1000

TY - JOUR

T1 - Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

AU - Roccapriore, Kevin M.

AU - Schwarzer, Max

AU - Greaves, Joshua

AU - Farebrother, Jesse

AU - Agarwal, Rishabh

AU - Bishop, Colton

AU - Ziatdinov, Maxim

AU - Mordatch, Igor

AU - Cubuk, Ekin D.

AU - Courville, Aaron

AU - Castro, Pablo Samuel

AU - Bellemare, Marc G.

AU - Kalinin, Sergei V.

PY - 2023/7/22

Y1 - 2023/7/22

UR - http://www.scopus.com/inward/record.url?scp=85168603192&partnerID=8YFLogxK

U2 - 10.1093/micmic/ozad067.1000

DO - 10.1093/micmic/ozad067.1000

M3 - Article

C2 - 37612921

AN - SCOPUS:85168603192

SN - 1431-9276

VL - 29

SP - 1932

EP - 1933

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 1

ER -

Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM

Access to Document

Other files and links

Cite this