Directional dilation for the connection of piece-wise objects: a semiconductor manufacturing case study

Shaun S. Gleason, Kenneth W. Tobin

Research output: Contribution to conferencePaperpeer-review

15 Scopus citations

Abstract

A technique for intelligent dilation of objects in an image was developed that, when compared to standard isotropic techniques, can create a better representative resultant image for subsequent morphological analysis. Individual masses in an image are forced to grow in preferential directions with varying degrees of strength according to a set of morphological parameters. These parameters are determined by applying a model based on gravitational force to determine the strength and direction of the 'attraction force' between objects. The result of this analysis is a collection of normalized dilation vectors for each object in the image, where each vector represents a potential direction for growth. Results of the application of this algorithm are shown on binary images of defect distributions on semiconductor wafers where a single defect (e.g., a scratch) can be made up of numerous, disconnected blobs.

Original languageEnglish
Pages9-12
Number of pages4
StatePublished - 1996
EventProceedings of the 1996 IEEE International Conference on Image Processing, ICIP'96. Part 2 (of 3) - Lausanne, Switz
Duration: Sep 16 1996Sep 19 1996

Conference

ConferenceProceedings of the 1996 IEEE International Conference on Image Processing, ICIP'96. Part 2 (of 3)
CityLausanne, Switz
Period09/16/9609/19/96

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