Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements

D. D. Fong, C. Cionca, Y. Yacoby, G. B. Stephenson, J. A. Eastman, P. H. Fuoss, S. K. Streiffer, Carol Thompson, R. Clarke, R. Pindak, E. A. Stern

Research output: Contribution to journal › Article › peer-review

108 Scopus citations