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Direct Probing of Polarization Charge at Nanoscale Level
Owoong Kwon
, Daehee Seol
, Dongkyu Lee
, Hee Han
, Ionela Lindfors-Vrejoiu
, Woo Lee
,
Stephen Jesse
,
Ho Nyung Lee
, Sergei V. Kalinin
, Marin Alexe
, Yunseok Kim
Functional Atomic Force Microscopy Group
Materials Science and Technology Div
Research output
:
Contribution to journal
›
Article
›
peer-review
32
Scopus citations
Overview
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Material Science
Atomic Force Microscopy
100%
Capacitance
25%
Density
25%
Electronic Circuit
25%
Ferroelectric Material
75%
Ferroelectricity
50%
Signal-to-Noise Ratio
25%
Thin Films
25%
Engineering
Additional Correction
20%
Atomic Force Microscopy
40%
Charge Density
20%
Conductive Atomic Force Microscopy
40%
Nanometre
40%
Nanoscale
100%
Parasitic Capacitance
20%
Signal-to-Noise Ratio
20%
Spontaneous Polarization
20%
Thin Films
20%