Abstract
Additive manufacturing (AM) has created the possibility of replacing traditional manufacturing techniques with faster, versatile, and cost-effective production options. In this study, we employed AM techniques to fabricate silicon carbide (SiC) radiation detectors based on commercial 4H-SiC wafers. Platinum (Pt) nanoparticle inks were synthesized and printed onto the surface of a 4H-SiC wafer using an aerosol jet printing technique to create Schottky diodes for radiation detection. The additive printed detectors were characterized for surface morphology through a scanning electron microscope (SEM) and atomic force microscope (AFM), and electronically by current-voltage (IV), capacitance-voltage (CV), and finally by alpha spectroscopy measurements. The printed detector achieved an energy resolution of 3.24% FWHM at 5.486 MeV, compared to 0.62% FWHM of a SiC detector fabricated by conventional cleanroom technologies and 0.3% FWHM of a commercially available Si detector.
Original language | English |
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Article number | 095041 |
Journal | AIP Advances |
Volume | 9 |
Issue number | 9 |
DOIs | |
State | Published - Sep 1 2019 |
Externally published | Yes |
Funding
This material is based upon work supported under an Integrated University Program Graduate Fellowship. We acknowledge the support from US. Department of Energy, National Nuclear Security Administration, DNN R&Ds Integrated University Program, Consortium for Enabling Technologies & Innovation. The authors also thank Dr. C. Dun for fabrication of Pt nanoparticles.
Funders | Funder number |
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Consortium for Enabling Technologies & Innovation | |
National Nuclear Security Administration | |
Office of Defense Nuclear Nonproliferation | |
Universiteit Stellenbosch |