Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Peng Gao; Christopher T. Nelson; Jacob R. Jokisaari; Yi Zhang; Seung Hyub Baek; Chung Wung Bark; Chang Beom Eom; Xiaoqing Pan

doi:10.1017/S1431927612011087

Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Peng Gao
, Christopher T. Nelson
, Jacob R. Jokisaari
, Yi Zhang
, Seung Hyub Baek
, Chung Wung Bark
, Chang Beom Eom
, Xiaoqing Pan

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1846-1847
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612011087
State	Published - Jul 2012
Externally published	Yes

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10.1017/S1431927612011087

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@article{c508e27fb08147e684b71e4fb9452ec7,

title = "Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy",

author = "Peng Gao and Nelson, \{Christopher T.\} and Jokisaari, \{Jacob R.\} and Yi Zhang and Baek, \{Seung Hyub\} and Bark, \{Chung Wung\} and Eom, \{Chang Beom\} and Xiaoqing Pan",

year = "2012",

month = jul,

doi = "10.1017/S1431927612011087",

language = "English",

volume = "18",

pages = "1846--1847",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S2",

}

TY - JOUR

T1 - Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

AU - Gao, Peng

AU - Nelson, Christopher T.

AU - Jokisaari, Jacob R.

AU - Zhang, Yi

AU - Baek, Seung Hyub

AU - Bark, Chung Wung

AU - Eom, Chang Beom

AU - Pan, Xiaoqing

PY - 2012/7

Y1 - 2012/7

UR - https://www.scopus.com/pages/publications/85008002287

U2 - 10.1017/S1431927612011087

DO - 10.1017/S1431927612011087

M3 - Article

AN - SCOPUS:85008002287

SN - 1431-9276

VL - 18

SP - 1846

EP - 1847

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

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