Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Peng Gao; Christopher T. Nelson; Jacob R. Jokisaari; Yi Zhang; Seung Hyub Baek; Chung Wung Bark; Chang Beom Eom; Xiaoqing Pan

doi:10.1017/S1431927612011087

Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Peng Gao, Christopher T. Nelson, Jacob R. Jokisaari, Yi Zhang, Seung Hyub Baek, Chung Wung Bark, Chang Beom Eom, Xiaoqing Pan

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1846-1847
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612011087
State	Published - Jul 2012
Externally published	Yes

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title = "Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy",

author = "Peng Gao and Nelson, {Christopher T.} and Jokisaari, {Jacob R.} and Yi Zhang and Baek, {Seung Hyub} and Bark, {Chung Wung} and Eom, {Chang Beom} and Xiaoqing Pan",

year = "2012",

month = jul,

doi = "10.1017/S1431927612011087",

language = "English",

volume = "18",

pages = "1846--1847",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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T1 - Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

AU - Gao, Peng

AU - Nelson, Christopher T.

AU - Jokisaari, Jacob R.

AU - Zhang, Yi

AU - Baek, Seung Hyub

AU - Bark, Chung Wung

AU - Eom, Chang Beom

AU - Pan, Xiaoqing

PY - 2012/7

Y1 - 2012/7

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U2 - 10.1017/S1431927612011087

DO - 10.1017/S1431927612011087

M3 - Article

AN - SCOPUS:85008002287

SN - 1431-9276

VL - 18

SP - 1846

EP - 1847

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

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