Direct metal pattern writing by VUV photodissociation

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Abstract

An efficient process for direct pattern writing of thin metallic films has been developed using a 121.6 nm vacuum ultraviolet source by photodissociation of metalorganic materials. The optical reflection, crystal structure, and surface morphology of photodissociated palladium thin films were studied using a spectrophotometer, x-ray diffraction, and scanning electron microscopy. A pattern of 5 μm palladium lines separated by 5 μm spaces was produced on glass substrate by contact printing lithography.

Original languageEnglish
Pages (from-to)3202-3205
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume22
Issue number6
DOIs
StatePublished - Nov 2004
Externally publishedYes

Funding

The authors thank Dr. Jousef Mohajer for his help in the determination of chemical compounds. This work was supported by the U.S. Defense Advanced Research Projects Agency (DARPA) under Contract No. DAAD 19-99-1-0277 and administered by the Army Research Office. Thanks to Cornell University National Nanofabrication Facility for fabrication of the masks.

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