Abstract
The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias amplitude and frequency, providing insight into electrostatic interactions in liquids. Real-space mapping of the vertical and lateral components of electrostatic forces acting on the tip from the deflection and torsion of the cantilever is demonstrated. This method enables direct probing of electrostatic and convective forces involved in electrophoretic and dielectroforetic self-assembly and electrical tweezer operation in liquid environments.
Original language | English |
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Article number | 014306 |
Journal | Journal of Applied Physics |
Volume | 103 |
Issue number | 1 |
DOIs | |
State | Published - 2008 |
Funding
Research was sponsored by the Division of Materials Sciences and Engineering (B.J.R., S.J., S.V.K.) and the Center for Nanophase Materials Sciences (K.S., A.P.B.), Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC for the Office of Basic Energy Sciences, U.S. Department of Energy.
Funders | Funder number |
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Center for Nanophase Materials Sciences | |
U.S. Department of Energy | |
Basic Energy Sciences | |
Oak Ridge National Laboratory | |
Division of Materials Sciences and Engineering |