Direct imaging of point defect configurations for Au inside Si nanowires

K. Van Benthem; S. H. Oh; A. Y. Borisevich; W. Luo; P. Werner; N. D. Zakharov; S. T. Pantelides; S. J. Pennycook

doi:10.1017/S1431927608087357

Direct imaging of point defect configurations for Au inside Si nanowires

K. Van Benthem, S. H. Oh, A. Y. Borisevich, W. Luo, P. Werner, N. D. Zakharov, S. T. Pantelides, S. J. Pennycook

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	204-205
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608087357
State	Published - Aug 2008

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10.1017/S1431927608087357

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title = "Direct imaging of point defect configurations for Au inside Si nanowires",

author = "Benthem, \{K. Van\} and Oh, \{S. H.\} and Borisevich, \{A. Y.\} and W. Luo and P. Werner and Zakharov, \{N. D.\} and Pantelides, \{S. T.\} and Pennycook, \{S. J.\}",

year = "2008",

month = aug,

doi = "10.1017/S1431927608087357",

language = "English",

volume = "14",

pages = "204--205",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

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T1 - Direct imaging of point defect configurations for Au inside Si nanowires

AU - Benthem, K. Van

AU - Oh, S. H.

AU - Borisevich, A. Y.

AU - Luo, W.

AU - Werner, P.

AU - Zakharov, N. D.

AU - Pantelides, S. T.

AU - Pennycook, S. J.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49549111361

U2 - 10.1017/S1431927608087357

DO - 10.1017/S1431927608087357

M3 - Article

AN - SCOPUS:49549111361

SN - 1431-9276

VL - 14

SP - 204

EP - 205

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Direct imaging of point defect configurations for Au inside Si nanowires

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