Direct imaging of point defect configurations for Au inside Si nanowires

K. Van Benthem; S. H. Oh; A. Y. Borisevich; W. Luo; P. Werner; N. D. Zakharov; S. T. Pantelides; S. J. Pennycook

doi:10.1017/S1431927608087357

Direct imaging of point defect configurations for Au inside Si nanowires

K. Van Benthem
, S. H. Oh
, A. Y. Borisevich
, W. Luo
, P. Werner
, N. D. Zakharov
, S. T. Pantelides
, S. J. Pennycook

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	204-205
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608087357
State	Published - Aug 2008

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10.1017/S1431927608087357

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title = "Direct imaging of point defect configurations for Au inside Si nanowires",

author = "Benthem, \{K. Van\} and Oh, \{S. H.\} and Borisevich, \{A. Y.\} and W. Luo and P. Werner and Zakharov, \{N. D.\} and Pantelides, \{S. T.\} and Pennycook, \{S. J.\}",

year = "2008",

month = aug,

doi = "10.1017/S1431927608087357",

language = "English",

volume = "14",

pages = "204--205",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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T1 - Direct imaging of point defect configurations for Au inside Si nanowires

AU - Benthem, K. Van

AU - Oh, S. H.

AU - Borisevich, A. Y.

AU - Luo, W.

AU - Werner, P.

AU - Zakharov, N. D.

AU - Pantelides, S. T.

AU - Pennycook, S. J.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49549111361

U2 - 10.1017/S1431927608087357

DO - 10.1017/S1431927608087357

M3 - Article

AN - SCOPUS:49549111361

SN - 1431-9276

VL - 14

SP - 204

EP - 205

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Direct imaging of point defect configurations for Au inside Si nanowires

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