Direct generation of ion beam images with a two-dimensional charge injection device

Paula R. Cable; Mark Parker; R. Kenneth Marcus; Joseph M. Pochkowski

doi:10.1016/S1044-0305(94)00104-8

Direct generation of ion beam images with a two-dimensional charge injection device

Paula R. Cable, Mark Parker, R. Kenneth Marcus, Joseph M. Pochkowski

Research output: Contribution to journal › Article › peer-review

Abstract

The use of a two-dimensional charge injection device (CID) to directly image the spatial profile of impingent positively charged ions is described. By this approach, no prior conversion from an ion beam to a photon image is required. Because of the positive response of the device to plasma photons, ions that emanated from the radiofrequency glow discharge source were diverted around a photon stop and focused onto the CID. The resultant ion images were digitized via an external image processor and corrected for dark current contributions. Two-dimensional ion images and single pixel line profiles are presented.

Original language	English
Pages (from-to)	140-147
Number of pages	8
Journal	Journal of the American Society for Mass Spectrometry
Volume	6
Issue number	2
DOIs	https://doi.org/10.1016/S1044-0305(94)00104-8
State	Published - 1995
Externally published	Yes

Funding

The authors gratefully acknowledge CID Technologies, Inc. and EPIX, Inc. for the use of equipment and for technical support. Project funding was provided by the South Carolina Universities Research and Education Foundation.

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10.1016/S1044-0305(94)00104-8

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abstract = "The use of a two-dimensional charge injection device (CID) to directly image the spatial profile of impingent positively charged ions is described. By this approach, no prior conversion from an ion beam to a photon image is required. Because of the positive response of the device to plasma photons, ions that emanated from the radiofrequency glow discharge source were diverted around a photon stop and focused onto the CID. The resultant ion images were digitized via an external image processor and corrected for dark current contributions. Two-dimensional ion images and single pixel line profiles are presented.",

author = "Cable, {Paula R.} and Mark Parker and {Kenneth Marcus}, R. and Pochkowski, {Joseph M.}",

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AU - Cable, Paula R.

AU - Parker, Mark

AU - Kenneth Marcus, R.

AU - Pochkowski, Joseph M.

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AB - The use of a two-dimensional charge injection device (CID) to directly image the spatial profile of impingent positively charged ions is described. By this approach, no prior conversion from an ion beam to a photon image is required. Because of the positive response of the device to plasma photons, ions that emanated from the radiofrequency glow discharge source were diverted around a photon stop and focused onto the CID. The resultant ion images were digitized via an external image processor and corrected for dark current contributions. Two-dimensional ion images and single pixel line profiles are presented.

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JO - Journal of the American Society for Mass Spectrometry

JF - Journal of the American Society for Mass Spectrometry

IS - 2

ER -

Direct generation of ion beam images with a two-dimensional charge injection device

Abstract

Funding

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