Diffraction of neutron standing waves in thin films with resonance enhancement

Huai Zhang; S. K. Satija; P. D. Gallagher; J. A. Dura; K. Ritley; C. P. Flynn; J. F. Ankner

doi:10.1016/0921-4526(95)00966-3

Diffraction of neutron standing waves in thin films with resonance enhancement

Huai Zhang, S. K. Satija, P. D. Gallagher, J. A. Dura, K. Ritley, C. P. Flynn, J. F. Ankner

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Diffraction of neutron standing waves in thin films has been demonstrated for the first time with experiments on an epi-taxial Y/Gd/Y/Nb/Al₂O₃ sample. Resonance enhancement in the diffraction intensity has been observed. The new diffraction scheme for neutrons and X-rays provides an oscillatory spatial concentration in thin films, in contrast to the evanescent diffraction which provides an exponential concentration. It also discriminates against diffraction background from substrate, and may be especially useful when diffraction in transmission geometry is not available due to high absorption of substrate.

Original language	English
Pages (from-to)	450-454
Number of pages	5
Journal	Physica B: Physics of Condensed Matter
Volume	221
Issue number	1-4
DOIs	https://doi.org/10.1016/0921-4526(95)00966-3
State	Published - Apr 2 1996
Externally published	Yes

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title = "Diffraction of neutron standing waves in thin films with resonance enhancement",

abstract = "Diffraction of neutron standing waves in thin films has been demonstrated for the first time with experiments on an epi-taxial Y/Gd/Y/Nb/Al2O3 sample. Resonance enhancement in the diffraction intensity has been observed. The new diffraction scheme for neutrons and X-rays provides an oscillatory spatial concentration in thin films, in contrast to the evanescent diffraction which provides an exponential concentration. It also discriminates against diffraction background from substrate, and may be especially useful when diffraction in transmission geometry is not available due to high absorption of substrate.",

author = "Huai Zhang and Satija, {S. K.} and Gallagher, {P. D.} and Dura, {J. A.} and K. Ritley and Flynn, {C. P.} and Ankner, {J. F.}",

year = "1996",

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T1 - Diffraction of neutron standing waves in thin films with resonance enhancement

AU - Zhang, Huai

AU - Satija, S. K.

AU - Gallagher, P. D.

AU - Dura, J. A.

AU - Ritley, K.

AU - Flynn, C. P.

AU - Ankner, J. F.

PY - 1996/4/2

Y1 - 1996/4/2

N2 - Diffraction of neutron standing waves in thin films has been demonstrated for the first time with experiments on an epi-taxial Y/Gd/Y/Nb/Al2O3 sample. Resonance enhancement in the diffraction intensity has been observed. The new diffraction scheme for neutrons and X-rays provides an oscillatory spatial concentration in thin films, in contrast to the evanescent diffraction which provides an exponential concentration. It also discriminates against diffraction background from substrate, and may be especially useful when diffraction in transmission geometry is not available due to high absorption of substrate.

AB - Diffraction of neutron standing waves in thin films has been demonstrated for the first time with experiments on an epi-taxial Y/Gd/Y/Nb/Al2O3 sample. Resonance enhancement in the diffraction intensity has been observed. The new diffraction scheme for neutrons and X-rays provides an oscillatory spatial concentration in thin films, in contrast to the evanescent diffraction which provides an exponential concentration. It also discriminates against diffraction background from substrate, and may be especially useful when diffraction in transmission geometry is not available due to high absorption of substrate.

UR - http://www.scopus.com/inward/record.url?scp=0030562921&partnerID=8YFLogxK

U2 - 10.1016/0921-4526(95)00966-3

DO - 10.1016/0921-4526(95)00966-3

M3 - Article

AN - SCOPUS:0030562921

SN - 0921-4526

VL - 221

SP - 450

EP - 454

JO - Physica B: Physics of Condensed Matter

JF - Physica B: Physics of Condensed Matter

IS - 1-4

ER -

Diffraction of neutron standing waves in thin films with resonance enhancement

Abstract

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