Abstract
Crystallographic textures are pervasive in ferroelectrics and underpin the functional properties of devices utilizing these materials because many macroscopic properties (e.g., piezoelectricity) require a non-random distribution of dipoles. Inducing a preferred grain texture has become a viable route to improve these functional properties. X-ray and neutron diffraction have become valuable tools to probe crystallographic textures. This paper presents an overview of qualitative and quantitative methods for assessing crystallographic textures in electroceramics (domain and grain textures) and discusses their strengths and weaknesses.
| Original language | English |
|---|---|
| Article number | 5633 |
| Journal | Materials |
| Volume | 14 |
| Issue number | 19 |
| DOIs | |
| State | Published - Oct 1 2021 |
Funding
Funding: A portion of this research used resources at the High Flux Isotope Reactor, a DOE Office of Science User Facility operated by the Oak Ridge National Laboratory. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility, operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. This work was supported by the U.S. National Science Foundation Grant No. DMR 0805022.
| Funders | Funder number |
|---|---|
| National Science Foundation | DMR 0805022 |
| U.S. Department of Energy | |
| Office of Science | |
| Argonne National Laboratory | DE-AC02-06CH11357 |
| Oak Ridge National Laboratory |
Keywords
- Crystallographic texture
- Diffraction
- Domain texture
- Ferroelectric
- Grain texture
- Rietveld