Abstract
A discussion on diffraction and correlation spectroscopy with coherent x-rays was presented. The discussion also presented the coherence properties of high-brilliance undulator beams and their application for x-ray photon correlation spectroscopy. The results depicted the speckle pattern of an aerogel sample illuminated with a 1.5 Å coherent x-ray beam and recorded with a 20 μm resolution direct illumination CCD camera.
| Original language | English |
|---|---|
| Pages (from-to) | 103-109 |
| Number of pages | 7 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3154 |
| DOIs | |
| State | Published - 1997 |
| Externally published | Yes |
| Event | Coherent Electron-Beam X-Ray Sources: Techniques and Applications - San Diego, CA, United States Duration: Jul 31 1997 → Aug 1 1997 |
Keywords
- Coherence
- Undulator sources
- X-ray photon correlation spectroscopy
- X-ray synchrotron radiation