Abstract
Multilayered ceramic capacitors (MLCCs) with BaTiO3-BaZrO3 (BTZ) dielectric layers were fabricated, and the dielectric permittivity of the BTZ layers with different thicknesses in MLCCs was measured. The dielectric permittivity of the BTZ ceramic disk was also measured under various ac electric fields. The variation in the dielectric behaviors with the thickness of BTZ layers in MLCCs was explained by the ac-field dependence of dielectric permittivity observed in the BTZ ceramic disk. The ac-field dependence of dielectric permittivity of BTZ was markedly observed below the temperature of a broad maximum in the dielectric permittivity versus temperature (ε versus T) curve. It was found that the temperature of the broad maximum shifted to the low-temperature side and the peak shape became asymmetric with increasing ac field. These changes in the dielectric properties under high ac fields were explained by a model of relaxors with the concept of the formation of polar microregions (PMRs) and the freezing of fluctuating dipoles in PMRs.
Original language | English |
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Pages (from-to) | 755-759 |
Number of pages | 5 |
Journal | Journal of Materials Research |
Volume | 17 |
Issue number | 4 |
DOIs | |
State | Published - Apr 2002 |
Externally published | Yes |