Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source

Harold S. Barnard; A. A. MacDowell; D. Y. Parkinson; S. V. Venkatakrishnan; F. Panerai; N. N. Mansour

doi:10.1117/12.2238305

Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source

Harold S. Barnard, A. A. MacDowell, D. Y. Parkinson, S. V. Venkatakrishnan, F. Panerai, N. N. Mansour

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

The Advanced Light Source (ALS) is a third-generation synchrotron X-ray source that operates as a user facility with more than 40 beamlines hosting over 2000 users per year. Synchrotron sources like the ALS provide high quality X-ray beams, with flux that is several orders of magnitude higher than lab-based sources. This is particularly advantageous for dynamic applications because it allows for high-speed, high-resolution imaging and microscale tomography. The hard X-ray beamline 8.3.2 at the Advanced Light Source enables imaging of samples at high temperatures and pressures, with mechanical loading and other realistic conditions using environmental test cells. These test cells enable experimental observation of samples undergoing dynamic microstructural changes in-situ. We present recent instrumentation developments that allow for continuous tomography with scan rates approaching 1 Hz per 3D image. In addition, our use of iterative reconstruction techniques allows for improved image quality despite fewer images and low exposure times used during fast tomography compared to traditional Fourier reconstruction methods.

Original language	English
Title of host publication	Developments in X-Ray Tomography X
Editors	Ge Wang, Stuart R. Stock, Bert Muller
Publisher	SPIE
ISBN (Electronic)	9781510603257
DOIs	https://doi.org/10.1117/12.2238305
State	Published - 2016
Externally published	Yes
Event	Developments in X-Ray Tomography X - San Diego, United States Duration: Aug 29 2016 → Aug 31 2016

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9967
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Developments in X-Ray Tomography X
Country/Territory	United States
City	San Diego
Period	08/29/16 → 08/31/16

Funding

Many people have contributed to the design and function of the beamline, Special mention to Mike Kritchner and Aaron Treger for their mechanical engineering design skills and Lee Yang, Ed Doming, Brian Smith and Yunian Lou for their Labview control software skills. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.

Funders	Funder number
U.S. Department of Energy	DE-AC02-05CH11231
Office of Science
Basic Energy Sciences

Keywords

X-ray
X-ray micro-Tomography
micro-tomography
synchrotron

Access to Document

10.1117/12.2238305

Cite this

Barnard, H. S., MacDowell, A. A., Parkinson, D. Y., Venkatakrishnan, S. V., Panerai, F., & Mansour, N. N. (2016). Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source. In G. Wang, S. R. Stock, & B. Muller (Eds.), Developments in X-Ray Tomography X Article 99671H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9967). SPIE. https://doi.org/10.1117/12.2238305

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title = "Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source",

abstract = "The Advanced Light Source (ALS) is a third-generation synchrotron X-ray source that operates as a user facility with more than 40 beamlines hosting over 2000 users per year. Synchrotron sources like the ALS provide high quality X-ray beams, with flux that is several orders of magnitude higher than lab-based sources. This is particularly advantageous for dynamic applications because it allows for high-speed, high-resolution imaging and microscale tomography. The hard X-ray beamline 8.3.2 at the Advanced Light Source enables imaging of samples at high temperatures and pressures, with mechanical loading and other realistic conditions using environmental test cells. These test cells enable experimental observation of samples undergoing dynamic microstructural changes in-situ. We present recent instrumentation developments that allow for continuous tomography with scan rates approaching 1 Hz per 3D image. In addition, our use of iterative reconstruction techniques allows for improved image quality despite fewer images and low exposure times used during fast tomography compared to traditional Fourier reconstruction methods.",

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author = "Barnard, {Harold S.} and MacDowell, {A. A.} and Parkinson, {D. Y.} and Venkatakrishnan, {S. V.} and F. Panerai and Mansour, {N. N.}",

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Barnard, HS, MacDowell, AA, Parkinson, DY, Venkatakrishnan, SV, Panerai, F & Mansour, NN 2016, Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source. in G Wang, SR Stock & B Muller (eds), Developments in X-Ray Tomography X., 99671H, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9967, SPIE, Developments in X-Ray Tomography X, San Diego, United States, 08/29/16. https://doi.org/10.1117/12.2238305

Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source. / Barnard, Harold S.; MacDowell, A. A.; Parkinson, D. Y. et al.
Developments in X-Ray Tomography X. ed. / Ge Wang; Stuart R. Stock; Bert Muller. SPIE, 2016. 99671H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9967).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Panerai, F.

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Barnard HS, MacDowell AA, Parkinson DY, Venkatakrishnan SV, Panerai F, Mansour NN. Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source. In Wang G, Stock SR, Muller B, editors, Developments in X-Ray Tomography X. SPIE. 2016. 99671H. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2238305

Developments in synchrotron X-ray micro-tomography for in-situ materials analysis at the Advanced Light Source

Abstract

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Keywords

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