Development of in situ electrochemical small-angle neutron scattering (eSANS) for simultaneous structure and redox characterization of nanoparticles

Vivek M. Prabhu, Vytas Reipa, Adam J. Rondinone, Eric Formo, Peter V. Bonnesen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

An in situ electrochemical small-angle neutron scattering (eSANS) method was developed to measure simultaneously the redox properties and size, shape and interactions of solution-dispersed nanomaterials. By combining multi-step potentials and chronocoulometry readout with SANS, the structure and redox properties of engineered nanomaterials are followed in one experiment. Specifically, ZnO nanoparticles were examined as dilute dispersions in pH buffered deuterium oxide solutions under negative electrode potentials. The ZnO disk-shaped nanoparticles undergo an irreversible size transformation upon reduction at the vitreous carbon electrode. The decrease in average nanoparticle size near a current maximum shows the reduction reaction from ZnO to Zn occurs. The eSANS method provides nanometer scale sensitivity to nanoparticle size and shape changes due to an electrochemical reaction that is crucial to understand in energy, healthcare, and other applications.

Original languageEnglish
Title of host publicationDielectrics for Nanosystems 7
Subtitle of host publicationMaterials Science, Processing, Reliability, and Manufacturing
EditorsD. Misra, D. Bauza, Z. Chen, K. B. Sundaram, Y. S. Obeng, T. Chikyow, H. Iwai
PublisherElectrochemical Society Inc.
Pages179-188
Number of pages10
Edition2
ISBN (Electronic)9781607687122
DOIs
StatePublished - 2016
EventSymposium on Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing - 229th ECS Meeting - San Diego, United States
Duration: May 29 2016Jun 2 2016

Publication series

NameECS Transactions
Number2
Volume72
ISSN (Print)1938-6737
ISSN (Electronic)1938-5862

Conference

ConferenceSymposium on Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing - 229th ECS Meeting
Country/TerritoryUnited States
CitySan Diego
Period05/29/1606/2/16

Bibliographical note

Publisher Copyright:
©The Electrochemical Society.

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