Development of a pepper-pot emittance meter for diagnostics of low-energy multiply charged heavy ion beams extracted from an ECR ion source

T. Nagatomo, V. Tzoganis, M. Kase, O. Kamigaito, T. Nakagawa

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Several fluorescent materials were tested for use in the imaging screen of a pepper-pot emittance meter that is suitable for investigating the beam dynamics of multiply charged heavy ions extracted from an ECR ion source. SiO2 (quartz), KBr, Eu-doped CaF2, and Tl-doped CsI crystals were first irradiated with 6.52-keV protons to determine the effects of radiation damage on their fluorescence emission properties. For such a low-energy proton beam, only the quartz was found to be a suitable fluorescent material, since the other materials suffered a decay in fluorescence intensity with irradiation time. Subsequently, quartz was irradiated with heavy 12C4+, 16O4+, and 40Ar11+ ions, but it was found that the fluorescence intensity decreased too rapidly to measure the emittance of these heavy-ion beams. These results suggest that a different energy loss mechanism occurs for heavier ions and for protons.

Original languageEnglish
Article number02B920
JournalReview of Scientific Instruments
Volume87
Issue number2
DOIs
StatePublished - Feb 1 2016
Externally publishedYes

Fingerprint

Dive into the research topics of 'Development of a pepper-pot emittance meter for diagnostics of low-energy multiply charged heavy ion beams extracted from an ECR ion source'. Together they form a unique fingerprint.

Cite this