Development of a consistent model to define the 186 keV count rate from 235U spectral measurements

Patrick Brukiewa; Belle R. Upadhyaya; Steven Revis; Jose March-Leuba; Taner Uckan; John E. Gunning

Development of a consistent model to define the 186 keV count rate from ²³⁵U spectral measurements

Patrick Brukiewa
, Belle R. Upadhyaya
, Steven Revis
, Jose March-Leuba
, Taner Uckan
, John E. Gunning

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	210-211
Number of pages	2
Journal	Transactions of the American Nuclear Society
Volume	101
State	Published - 2009
Externally published	Yes
Event	2009 ANS Annual Meeting and Embedded Topical Meetings: Risk Management and 2009 Young Professionals Congress - Washington, DC, United States Duration: Nov 15 2009 → Nov 19 2009

Cite this

@article{014e49fd46404bed999b3e01f1fe0cb5,

title = "Development of a consistent model to define the 186 keV count rate from 235U spectral measurements",

author = "Patrick Brukiewa and Upadhyaya, \{Belle R.\} and Steven Revis and Jose March-Leuba and Taner Uckan and Gunning, \{John E.\}",

year = "2009",

language = "English",

volume = "101",

pages = "210--211",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

note = "2009 ANS Annual Meeting and Embedded Topical Meetings: Risk Management and 2009 Young Professionals Congress ; Conference date: 15-11-2009 Through 19-11-2009",

}

TY - JOUR

T1 - Development of a consistent model to define the 186 keV count rate from 235U spectral measurements

AU - Brukiewa, Patrick

AU - Upadhyaya, Belle R.

AU - Revis, Steven

AU - March-Leuba, Jose

AU - Uckan, Taner

AU - Gunning, John E.

PY - 2009

Y1 - 2009

UR - https://www.scopus.com/pages/publications/84875741425

M3 - Conference article

AN - SCOPUS:84875741425

SN - 0003-018X

VL - 101

SP - 210

EP - 211

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

T2 - 2009 ANS Annual Meeting and Embedded Topical Meetings: Risk Management and 2009 Young Professionals Congress

Y2 - 15 November 2009 through 19 November 2009

ER -

Development of a consistent model to define the 186 keV count rate from 235U spectral measurements

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Cite this

Development of a consistent model to define the 186 keV count rate from ²³⁵U spectral measurements