Abstract
X-ray detection limit and sensitivity are important figure of merits for perovskite X-ray detectors, but literatures lack a valid mathematic expression for determining the lower limit of detection for a perovskite X-ray detector. In this work, we present a thorough analysis and new method for X-ray detection limit determination based on a statistical model that correlates the dark current and the X-ray induced photocurrent with the detection limit. The detection limit can be calculated through the measurement of dark current and sensitivity with an easy-to-follow practice. Alternatively, the detection limit may also be obtained by the measurement of dark current and photocurrent when repeatedly lowering the X-ray dose rate. While the material quality is critical, we show that the device architecture and working mode also have a significant influence on the sensitivity and the detection limit. Our work establishes a fair comparison metrics for material and detector development.
| Original language | English |
|---|---|
| Article number | 5258 |
| Journal | Nature Communications |
| Volume | 12 |
| Issue number | 1 |
| DOIs | |
| State | Published - Dec 1 2021 |
Funding
This work was supported by the U.S. Department of the Defense, Defense Threat Reduction Agency under Grant HDTRA1-19-1-0024 and partially supported by the U. S. Department of Energy/National Nuclear Security Administration under Award Number DE-NA0003921. W.N. and S.S. acknowledges the Los Alamos National Laboratory’s LDRD Mission Foundation Project. Their work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy, Office of Science by Los Alamos National Laboratory (Contract 89233218CNA000001) and Sandia National Laboratory (Contract DE-NA-0003525). We thank Miss. Qingyu Chen, Ph.D. student at The Ohio State University, for the helpful discussion of the relevant statistical theory.